Part II.  Electron Microbeam techniques.  Principles and practical application of electron beam instruments.  Labs cover practical exercises demonstrating lecture topics as well as training on the use of the departmental Cameca MBX electron microprobe. 

1.  Electron-sample interaction phenomena and characteristic x-rays

2. Principles and construction of the  scanning electron microscope (SEM) and electron probe microanalysis (EPMA).

            a) Electron gun

            b) Electromagnetic lenses

            c) Secondary and backscattered electron detectors

            d) Wavelength dispersive spectrometers

            e) Energy dispersive spectrometers

3. Statistics of x-ray counting and analytical errors

4.  Theory of quantitative analysis using alpha factor (Bence-Albee), and ZAF- and PRZ-type correction  routines.